| #8336499 in Books | 2016-04-13 | 2016-04-21 | Original language:English | PDF # 1 | 9.25 x.26 x6.10l,.0 | File type: PDF | 106 pages|
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental da...
You easily download any file type for your device.CMOS RF Circuit Design for Reliability and Variability (SpringerBriefs in Applied Sciences and Technology) | Jiann-Shiun Yuan. A good, fresh read, highly recommended.