[PDF.12lv] Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

[PDF.gz96] Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

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 | #5346221 in Books |  Breitenstein O Warta Wilhelm Langenkamp Martin |  2010-09-07 | Original language:English | PDF # 1 |  9.21 x.63 x6.14l,1.10 | File type: PDF | 258 pages

 | Lock In Thermography Basics and Use for Evaluating Electronic Devices and Materials

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||From the Back Cover|This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

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